Session: 03-07-01: Innovative Product Design and Manufacturing
Paper Number: 119032
119032 - Development of a Piezoelectric Actuator for an Atomic Force Microscope for Eliminating the Cross-Coupling Effect
Atomic Force Microscopy (AFM) is a powerful imaging technique widely used in various scientific fields. However, the presence of cross-coupling effects can hinder the achievement of accurate and distortion-free imaging. The cross-coupling effect arises when the motion of the sample stage influences the position of the AFM tip, resulting in distorted images. To address this challenge, this study proposes a mechanical approach for mitigating the cross-coupling effect in AFM systems. In this research, a novel nano scanner design is presented, which eliminates the placement of the sample far from the piezoelectric element. By reducing the distance between the sample and the piezoelectric, it aims to achieve higher displacement without significant cross-coupling effects. Furthermore, a motion magnifier mechanism is utilized, allowing for higher displacements while minimizing cross-coupling. The integration of this mechanical approach, including the elimination of joints in the AFM scanner and the incorporation of a motion magnifier, enables nanoscale surface topography measurements without the adverse impact of the cross-coupling effect. To evaluate the performance of the proposed system, natural frequency tests were conducted, and a piezoelectric extension of the ANSYS software was employed for testing purposes. The output displacement of the scanner was calculated to be approximately 120 µm when applying a potential of -30 to 120 V to the piezo actuator. These results indicate that the mechanism is fully usable for AFM applications. Based on the successful performance and the resulting output displacement, it is concluded that the scanner design is suitable for mass production. The elimination of joints in the AFM scanner design plays a crucial role in minimizing the cross-coupling effect. Traditional scanners often incorporate multiple joints, which can introduce unwanted motion and contribute to the cross-coupling effect. By removing these joints, the proposed scanner design reduces mechanical interactions and enhances the overall stability of the system. This design also enables precise motion control, ensuring accurate positioning of the AFM tip during imaging. The motion magnifier mechanism further amplifies the displacement range of the scanner while minimizing the cross-coupling effect. This mechanism consists of carefully designed flexures that translate the motion of the piezoelectric actuator into a larger displacement at the AFM tip. By strategically configuring the flexures, the motion can be amplified in the desired direction while suppressing any unwanted cross-coupling effects caused by sample stage motion. The successful implementation of the proposed scanner design opens up new possibilities for AFM applications. Researchers can now achieve high-resolution imaging with improved accuracy and reliability, even in scenarios where sample stage motion would typically introduce distortions. This advancement has significant implications for various scientific disciplines, including materials science, nanotechnology, biology, and surface analysis. The developed scanner design not only overcomes the cross-coupling effect but also demonstrates feasibility for mass production. The natural frequency tests ensure that the scanner operates within acceptable limits, ensuring stability during operation. The integration of piezoelectric extensions within the ANSYS software facilitates comprehensive testing and validation of the scanner's performance.
Presenting Author: Mohammad Amin Ahouei Wichita State University
Presenting Author Biography: A curious person who fortunately is a Mechanical Engineer. My specific research field is motion mechanisms and fine adjustment actuators I have more than 10 years of relevant experience in it. Eager to face big technical challenges that usually lead to solving serious problems of companies. Skilled in CAD and CAE (professional in Solid Works and ANSYS). Designing a nano-positioner with piezoelectric and also a ball screw actuator for Ara-Research Co products (Atomic Force Microscope(AFM) is part of my professional experience. I also had more than 4 years experiment to manage the mechanical engineering department in Jam-Mechatronics. Then upon the request of the Pardiotech Company founder for 2 years, I was the head of the mechanical department, the company is a manufacturer of Radiography Production and exclusively design and manufacture Bone Mineral Detector (BMD) in Iran
Now as a Research Assistant at WSU I'm pursuing my PhD in mechanical engineering and my specific field of research is the mechanical properties of nanomaterial which is using green hydrogen production. MXenes is one of the extraordinary nanosheets that is highly capable to be a photocatalyst. I LOVE this field because it protects our planet🌍 for the next generations by using renewable energy🔆 instead of fossil fouls.
Authors:
Mohammad Amin Ahouei Wichita State UniversityHamid Lankarani Wichita State University
Mohsen Jafari Wichita State University
Arian Gerami Wichita State University
Development of a Piezoelectric Actuator for an Atomic Force Microscope for Eliminating the Cross-Coupling Effect
Paper Type
Technical Presentation